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An Integrated Automatic Test Pattern Generation and Implementation Using Device Under Test (DUT)

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Category
Conference
Authors
Sharmili. R & Venkataramanan V
Conference Name
NCCSVD-14
Conference From
01-Jan-2014
Conference To
03-Jan-2014
Conference Venue
Coimbatore
  • Abstract

An Integrated Automatic Test Pattern Generation and Implementation Using Device Under Test (DUT)

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